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CS5467
8.4 Page 2 Registers
8.4.1 Voltage Sag and Current Fault Duration (V1Sag DUR , V2Sag DUR , I1Fault DUR , I2Fault DUR )
Address: 0 ( V1Sag DUR ), 8 ( V2Sag DUR ), 4 ( I1Fault DUR ), 12 ( I2Fault DUR )
MSB
LSB
0
2 22
2 21
2 20
2 19
2 18
2 17
2 16
.....
2 6
2 5
2 4
2 3
2 2
2 1
2 0
Default = 0
Voltage sag duration, V1Sag DUR ( V2Sag DUR ) and current fault duration, I1Fault DUR ( I2Fault DUR ) determine
the count of output word rate (OWR) samples utilized to determine a sag or fault event. These are integers in
the range of 0 to 8,388,607 samples. A value of zero disables the feature.
8.4.2 Voltage Sag and Current Fault Level (V1Sag LEVEL , V2Sag LEVEL , I1Fault LEVEL , I2Fault LEVEL )
Address: 1 ( V1Sag LEVEL ), 9 ( V2Sag LEVEL ), 5 ( I1Fault LEVEL ), 13 ( I2Fault LEVEL )
MSB
LSB
-(2 0 )
2 -1
2 -2
2 -3
2 -4
2 -5
2 -6
2 -7
.....
2 -17
2 -18
2 -19
2 -20
2 -21
2 -22
2 -23
Default = 0
Voltage sag level, V1Sag LEVEL ( V2Sag LEVEL ) and current fault level, I1Fault LEVEL ( I2Fault LEVEL ) establish
an input level below which a sag or fault is triggered. These are two's complement values in the range of
-1.0 ? value ? 1.0, with the binary point to the right of the MSB. Negative values are not used.
8.5 Page 5 Register
8.5.1 Temperature Measurement (T MEAS ) – Address: 26
MSB
LSB
2 23
2 22
2 21
2 20
2 19
2 18
2 17
2 16
.....
2 6
2 5
2 4
2 3
2 2
2 1
2 0
Default = 0
The Temperature Measurement ( T MEAS ) register is used to cycle-steal voltage channel2 for temperature
measurement. Writing a one to the LSB causes the temperature to be measured and the Temperature register
( T ) to be updated.
Refer to 6.13 Temperature Measurement on page 22 for more information.
DS714F3
39
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